title: specification control drawing pa rt identifier: description: chip attenuator with high reliability testing. note: sing le lo t and date co de available upo n req u est. a ssembly dwg : n/a 1.0 specifica t io ns: 1.1 electrical: 1.1.1 impedance: 50 ohms nominal. 1.1.2 frequency range: dc-12.4 ghz. 1.1.3 attenuation values available: 0-20db in 0.5db increments. 1.1.4 attenuation accuracy : see table. a ttenua tion a ccura cy db dc - 4 ghz 4 - 8 ghz 8 - 12.4 ghz 0 - 0 , + . 3 - 0 , + . 5 - 0 , + . 5 .5 ? 3.5 0.3 0.5 0.5 4 ? 6.5 0.4 0.5 0.5 7 ? 10.5 0.5 0.5 0.75 11 ? 15.5 0.75 + 0.5,-3.0 + 0.5,-3.5 10 ? 20 1.0 + 0.5,-4.0 + 1.0,-6.0 1.1.5 vswr: dc - 4 ghz - 1.25 max 8 - 12.4 ghz - 1.50 max 4 - 8 ghz - 1.35 max 1.1.6 input power: 100 milliwatts cw. 1.1.6.1 full rated power to 125 c, derated linearly to 0 watts at 150 c. 1.1.6.2 peak po wer, 1 watts fo r 10us pulse width @ 1% duty cy cle. 1.2 mechanical: 1.2.1 o u tline dwg : see sheet 3. 1.2.2 workmanship: per mil-prf-55342. 1.3 enviro nmental: 1.3.1 altitude: 1.3.1.1 non-operating: sea level to 50,000 feet. 1.3.1.2 operating: sea level to 50,000 feet. 1.3.2 temperature range: 1.3.2.1 non-operating: -55 c to +150 c. 1.3.2.2 operating: -55c to +150c. 1.3.3 vibration: per mil-std-202, method 204, cond. d. 1.3.4 shock: per mil-std-202, method 213, cond. i. 1.3.5 moisture resistance: per mil-st d-202, method 106 except subcy c le steps 7a and 7b and po larizatio n and lo ad are no t applicable. 1.4 electrostatic discharge control: per mil-std-1686. 2.0 unit ma rking: marked with color dots. background co lor violet for half db values. legibility and permanency per mil-std-130. 3.0 qua l ity a ssura nce: 3.1 verify 100% visual pre-cap in spection performed per tp-8965. 3.2 perfom group a, b and/or c testing as indicated by the part number per tp-8965. 3.2.1 g r o u p a testing 3.2.1.1 visual and mechnical inspection per sheet 3. 3.2.1.2 initial rf measurements ? measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.1.3 thermal shock ? 10 cy cles from -55c to +125c. 3.2.1.4 after thermal shock rf measureme nts - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. eng pur mfg plan sm cc qa emc technology cage code # 24602 dwg # 1010085000 8851 sw old kansas ave. cha nge notice en 04-e049 rev lvl - stuart, fl 34997 sheet 1 of 3 3.2.1.5 burn-in ? duration of 168 hrs at input power of per 1.1.6.
emc technology cage code # 24602 dwg # 1010085000 8851 sw old kansas ave. change notice en 04-e049 rev lvl - stuart, fl 34997 sheet 2 of 3 3.2.2 group b testing (7 samples approved from group a). 3.2.2.1 sub-group 1 (3 samples) 3.2.2.1.1 low temperature operation 3.2.2.1.1.1 use final electrical measurements from group a. 3.2.2.1.1.2 dissipate low power for a duration of 45 +5/-0 minutes. allow to stabilize at 25c for 24 hours. 3.2.2.1.2 after low temperature electr ical measurements - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.2.1.3 high temperature bake ? +125c +/- 5c for 100 hrs then stabilize at 25c for 4 hrs. 3.2.2.1.3.1 visual examination. inspect for evidence of mechancial damage. 3.2.2.1.4 after high temperature bake electrical test - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.2.1.5 termination adhesion - solder a wire and pull with 15 grams perpendicular to and away from the surface area. 3.2.2.1.5.1 visual inspection ? there shall be no separation of material. 3.2.2.1.6 termination solderability immerse each sample 5 seconds in a solder pot held at 220c +/- 5c using 60/40 or 63/37 tin-lead composition. 3.2.2.2 sub-group 2 (4 samples) 3.2.2.2.1 initial rf measurements - use final electrical measurements from group a. 3.2.2.2.2 life test ? operate samples uni ts for 1000 hrs at 70c at input power per 1.1.6 . electrical measurements shall be made at 250 +48/-0 hrs, 500 +48/- 0 hrs, and 1000 +48/-0 hrs. 3.2.2.2.3 final rf measurements - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.3 group c (qci testing 4 samples approved from group a). 3.2.3.1 load life test ? burn-in units at 70c with input power per 1.1.6 for a duration of 1000 hours (1 ? hours on, ? hour off). measure and record electricals at 0, 250, 500, and 1000 hours. 3.2.3.2 after load life rf measurements ? measure and record vswr and attenuation at 1 ghz at 25c. test acceptable limits per 4.2.1 of tp-8965. 3.4 test data requirements: 3.4.1 test data required for cus tomer - see paragraph 5.0 of tp-8965. 3.4.2 data retention - 24 months. 3.4.3 test samples required for customer - see paragraph 5.0 of tp-8965. 4.0 packaging: standard pack per mc0023. (serialized waffle pack)
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